Slideshow
Introduction
Self-sensing probes integrate the deflection sensor into the cantilever, simplifying setup and enabling measurements inside instruments with limited optical access.
■ Built-in deflection sensing
■ Seamless integration into challenging environments
■ No laser alignment
■ Minimal downtime during probe changes.
DURABILITY
Hardened probes that hold their performance
Wear-resistant probes maintain their electrical and mechanical characteristics scan after scan.
■ Fewer probe changes
■ Reliable performance
■ Reduced operating costs
CONDUCTIVITY
Confidence-inspiring consistency
A proprietary probe formation process delivers consistently high electrical conductivity, so the signal you record comes from your sample, not from tip variability.
■ Consistent, high electrical conductivity
■ Repeatable performance
■ Reliable data
CHARGE DISSIPATION
Enhance your electron microscope
Non-conductive AFM probes can accumulate charge when operated in electron beam environments, disturbing the tip-sample interaction. Conductive probes provide a path for that charge to dissipate, delivering stable and accurate measurements.
■ Minimized probe-sample charging
■ Fewer artifacts, less drift, more usable data
■ Specially designed for electron beam applications
Inquire about upgrading your system with self-sensing technology